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QUICK NON-DESTRUCTIVE ANALYSIS OF THE MATERIAL COMPOSITION AND QUALITY
powders, fibers, films, slurries, pastes, intact products
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Description
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- Easy to operate
- No operator training required
- Graphical user-friendly interface
(Operates in Windows® 95/98)
- Step-by-step menu
- High flexibility in analysis methods
- Accommodates most of chemometrics prediction algorithms
- Customizable analysis routines
- Integrated database system
- Innovative hardware
- NIR-transmission technique applied
- Built-in diagnostics
- Network capability
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NIR-spectroscopy
Is based on the use of a rapid analysis of the material composition and quality of a sample from its FT-NIR diffuse reflectance spectrum registered with a bi-directional optical fiber probe.
- using NIR Spectroscopy - the most modern technique of spectral analysis
- accuracy of wavelength installation, high resolution, high energy throughput
- low-cost, reagent-free analysis
- high speed measurements
- non-destructive analysis, most of sample types are analyzed without preparation in the laboratoryand at the production line
- the samples can be analyzed in their original containers without any preparation
- rapid simultaneous determination of all calibrated parameters
- the possibility of replenishment the calibration database and development of own calibrations
- ready to training, everybody can make routine measurements after short training course
- the modern user-freindly software
- high level of automation of operation
- Pharmaceutical
- Agriculture
- Chemical industry
- Fuels; Oil, Refining, and Blending industries
- Polymers
- Textiles
- Cosmetics
- Pulp and Papar industry
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| Specifications |
| Spectral range |
1000-2200
nm (10000-4500 cm-1) |
| Spectral resolution
without apodization |
0.65
cm-1 |
| Reproducibility
of wavenumber measurements |
±0.004
cm-1 |
| Wavenumber
measurement error |
±0.02
cm-1 |
| Detector |
PD-24-20 |
| Reflectance
Probe |
Optical fibers:
Probe tip materials: |
Low OH fibers,
Ø 200μ (without coating)
Minimum bend radius: 200 mm
Stainless steel with sapphire window
No adhesives used |
| Signal-to-noise
ratio on the 2m Reflectance Probe, %, at resolution of 4 cm-1,
with a one minute measurement time |
Better
than 5000:1 (peak-to-peak% R for 100% line) at 6000±100 cm-1 |
| Level of positive
and negative pseudo scattered light, reflectance % |
±0.25 |
| Deviation of
the 100% line from the rated value during 8 h operation after ½
h warm-up, %, at resolution of 4 cm-1 |
±0.5 |
| Warm-up time
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approx.
1/2 hour at 25°C |
| Reproducibility
of absorbance measurements |
0.005
Au |
| Absorbance
measurement error |
0.05
Au |
| Power requirements |
90-260
Vac, 60/50 Hz ±2 Hz |
| Power consumption |
130
VA |
| Dimensions |
533x340x305
ìì |
| Weight |
28
kg |
| Operating conditions |
5°
- 40°C, up to 95% relative humidity,non-condensing Optics sealed
against humidityand dust |
| PC-system requirements |
Windows®-95/98/NT
or higher versions |
| Connection
to PC |
Parallel
interface in EPP mode |
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RECOMMENDED SET TO BE SUPPLIED AND OPTIONS
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FT20 NIR-analyzer
Fiber Optic reflectance probe
FT20 NIR-analyzer and attachments are covered by 12-months warranty.
Installation and commissioning of LUMEX instruments can be carried out at a Customer site by our service engineers. Personnel training specific to the customer needs can also be provided. Free delivery of spare parts and repair of the instruments are provided within the warranty period.
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